Estimation of partition size for IDDQ testing using built-in current sensing

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 68-72

  Menon, S M ^a   Palmgren, M ^a  

^a SOUTH DAKOTA SCHOOL OF MINES AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ELECTRIC CURRENTS; MONTE CARLO METHODS; TESTING; VLSI CIRCUITS;

BUILT-IN CURRENT SENSING; IDDQ TEST;

CMOS INTEGRATED CIRCUITS;

EID: 0031334988     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)