Standard cell library characterization for setting current limits for IDDQ testing

Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

Volumn , Issue , 1996, Pages 41-44

  Millman, S D ^a   Acken, J M ^b  

^a MOTOROLA INC   (United States)

^b Tenet   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS;

CURRENT LIMITS; DEFECTIVE PARTS; DESIGN AND TESTS; DESIGN FOR TEST; DESIGN PROCESS; HIGH-QUALITY PRODUCTS; INDUSTRY NEEDS; SETTING CURRENT;

PRODUCT DESIGN;

EID: 0002018073     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDDQ.1996.557810     Document Type: Conference Paper

References (15)

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