Analog and mixed-signal benchmark circuits - first release

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 183-190

  Kaminska, B ^a   Arabi, K ^a   Bell, I ^a   Goteti, P ^a   Huertas, J L ^a   Kim, B ^a   Rueda, A ^a   Soma, M ^a  

^a Opmaxx

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; SCHEMATIC DIAGRAMS; STANDARDS;

MIXED SIGNAL TESTING; SOFTWARE PACKAGE HSPICE;

INTEGRATED CIRCUIT TESTING;

EID: 0031343438     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)