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Volumn 44, Issue 6, 1997, Pages 951-956

A low-resistance self-aligned T-shaped gate for high-performance sub-0.1-μm CMOS

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; GATES (TRANSISTOR); MOS DEVICES; OSCILLATORS (ELECTRONIC); SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH;

EID: 0031164495     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.585550     Document Type: Article
Times cited : (9)

References (15)
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    • K. F. Lee et al., "Room temperature 0.1-μm CMOS technology with 11.8-ps gate delay," in IEDM Tech. Dig., 1993, pp. 131-134.
    • In IEDM Tech. Dig.
    • Lee, K.F.1
  • 2
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    • "High-performance 0. l-μm CMOS devices with 1.5-V power supply," 1993, pp. 127-130.
    • Y. Taur et al., "High-performance 0. l-μm CMOS devices with 1.5-V power supply," in IEDM Tech. Dig., 1993, pp. 127-130.
    • In IEDM Tech. Dig.
    • Taur, Y.1
  • 3
    • 85008051623 scopus 로고    scopus 로고
    • "A high-performance 0.15-μm CMOS," 1993, pp. 93-94.
    • G. G. Shahidi et al., "A high-performance 0.15-μm CMOS," in Symp. VLSI Technol., 1993, pp. 93-94.
    • In Symp. VLSI Technol.
    • Shahidi, G.G.1
  • 6
    • 0028737006 scopus 로고    scopus 로고
    • "Self-aligned tungsten strapped source/drain and gate technology realizing the lowest sheet resistance for sub-quarter micron CMOS," 1994, pp. 493-496.
    • M. Sekine et al., "Self-aligned tungsten strapped source/drain and gate technology realizing the lowest sheet resistance for sub-quarter micron CMOS," in IEDM Tech. Dig., 1994, pp. 493-496.
    • In IEDM Tech. Dig.
    • Sekine, M.1
  • 7
    • 0026108044 scopus 로고    scopus 로고
    • 2 junction formation in submicrometer CMOS devices," vol. 38, pp. 246-254, Feb. 1991.
    • 2 junction formation in submicrometer CMOS devices," IEEE Trans. Electron Devices, vol. 38, pp. 246-254, Feb. 1991.
    • IEEE Trans. Electron Devices
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  • 9
    • 0023591466 scopus 로고    scopus 로고
    • "Selective CVD tungsten suicide for VLSI applications," 1987, pp. 213-216.
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    • In IEDM Tech. Dig.
    • Ohba, T.1    Inoue, S.2    Maeda, M.3
  • 11
    • 0029512252 scopus 로고    scopus 로고
    • "High-performance sub-0.1-μm CMOS with low-resistance T-shaped gate fabricated by selective CVD-W," 115-116, 1995.
    • D. Hisamoto, K. Umeda, Y. Nakamura, N. Kobayashi, S. Kimura, and R. Nagai, "High-performance sub-0.1-μm CMOS with low-resistance T-shaped gate fabricated by selective CVD-W," VLSI Technol., pp. 115-116, 1995.
    • VLSI Technol., Pp.
    • Hisamoto, D.1    Umeda, K.2    Nakamura, Y.3    Kobayashi, N.4    Kimura, S.5    Nagai, R.6
  • 12
    • 0006405069 scopus 로고    scopus 로고
    • "Three-dimensional device simulator CADDETH with highly convergent matrix solution algorithms," 32, pp. 2038-2044, Oct. 1985.
    • T. Toyabe, H. Masuda, Y. Aoki, H. Shukuri, and T. Hagiwara, "Three-dimensional device simulator CADDETH with highly convergent matrix solution algorithms," IEEE Trans. Electron Devices, vol. ED-32, pp. 2038-2044, Oct. 1985.
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  • 13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.