-
1
-
-
0027845137
-
-
"Room temperature 0.1-μm CMOS technology with 11.8-ps gate delay," 1993, pp. 131-134.
-
K. F. Lee et al., "Room temperature 0.1-μm CMOS technology with 11.8-ps gate delay," in IEDM Tech. Dig., 1993, pp. 131-134.
-
In IEDM Tech. Dig.
-
-
Lee, K.F.1
-
2
-
-
0027879328
-
-
"High-performance 0. l-μm CMOS devices with 1.5-V power supply," 1993, pp. 127-130.
-
Y. Taur et al., "High-performance 0. l-μm CMOS devices with 1.5-V power supply," in IEDM Tech. Dig., 1993, pp. 127-130.
-
In IEDM Tech. Dig.
-
-
Taur, Y.1
-
3
-
-
85008051623
-
-
"A high-performance 0.15-μm CMOS," 1993, pp. 93-94.
-
G. G. Shahidi et al., "A high-performance 0.15-μm CMOS," in Symp. VLSI Technol., 1993, pp. 93-94.
-
In Symp. VLSI Technol.
-
-
Shahidi, G.G.1
-
4
-
-
0026046773
-
-
"A deep-submicrometer microwave/digital CMOS/SOS technology," vol. 12, pp. 16-17, Jan. 1991.
-
A. E. Schmitz, R. H. Weiden, L. E. Larson, S. E. Rosenbaum, R. A. Metzger, J. R. Behnke, and P. A. Macdonald, "A deep-submicrometer microwave/digital CMOS/SOS technology," IEEE Electron Device Lett., vol. 12, pp. 16-17, Jan. 1991.
-
IEEE Electron Device Lett.
-
-
Schmitz, A.E.1
Weiden, R.H.2
Larson, L.E.3
Rosenbaum, S.E.4
Metzger, R.A.5
Behnke, J.R.6
Macdonald, P.A.7
-
5
-
-
33747713759
-
-
"Ultra-thin SOI CMOS with selective CVD tungsten for low-resistance source and drain," 1992, pp. 829-832.
-
D. Hisamoto, K. Nakamura, M. Saito, N. Kobayashi, S. Kimura, R. Nagai, T. Nishida, and E. Takeda, "Ultra-thin SOI CMOS with selective CVD tungsten for low-resistance source and drain," in IEDM Tech. Dig., 1992, pp. 829-832.
-
In IEDM Tech. Dig.
-
-
Hisamoto, D.1
Nakamura, K.2
Saito, M.3
Kobayashi, N.4
Kimura, S.5
Nagai, R.6
Nishida, T.7
Takeda, E.8
-
6
-
-
0028737006
-
-
"Self-aligned tungsten strapped source/drain and gate technology realizing the lowest sheet resistance for sub-quarter micron CMOS," 1994, pp. 493-496.
-
M. Sekine et al., "Self-aligned tungsten strapped source/drain and gate technology realizing the lowest sheet resistance for sub-quarter micron CMOS," in IEDM Tech. Dig., 1994, pp. 493-496.
-
In IEDM Tech. Dig.
-
-
Sekine, M.1
-
7
-
-
0026108044
-
-
2 junction formation in submicrometer CMOS devices," vol. 38, pp. 246-254, Feb. 1991.
-
2 junction formation in submicrometer CMOS devices," IEEE Trans. Electron Devices, vol. 38, pp. 246-254, Feb. 1991.
-
IEEE Trans. Electron Devices
-
-
Lu, C.-Y.1
-
8
-
-
33747741657
-
-
"A new approach to the suppression of tunneling," 103-109, 1987.
-
Y. Kusumoto, K. Takakuwa, H. Hashinouchi, T. Ikuta, and I. Nakayama, "A new approach to the suppression of tunneling," Tungsten and Other Refractory Metals for VLSI Appl., pp. 103-109, 1987.
-
Tungsten and Other Refractory Metals for VLSI Appl., Pp.
-
-
Kusumoto, Y.1
Takakuwa, K.2
Hashinouchi, H.3
Ikuta, T.4
Nakayama, I.5
-
9
-
-
0023591466
-
-
"Selective CVD tungsten suicide for VLSI applications," 1987, pp. 213-216.
-
T. Ohba, S. Inoue, and M. Maeda, "Selective CVD tungsten suicide for VLSI applications," in IEDM Tech. Dig., 1987, pp. 213-216.
-
In IEDM Tech. Dig.
-
-
Ohba, T.1
Inoue, S.2
Maeda, M.3
-
11
-
-
0029512252
-
-
"High-performance sub-0.1-μm CMOS with low-resistance T-shaped gate fabricated by selective CVD-W," 115-116, 1995.
-
D. Hisamoto, K. Umeda, Y. Nakamura, N. Kobayashi, S. Kimura, and R. Nagai, "High-performance sub-0.1-μm CMOS with low-resistance T-shaped gate fabricated by selective CVD-W," VLSI Technol., pp. 115-116, 1995.
-
VLSI Technol., Pp.
-
-
Hisamoto, D.1
Umeda, K.2
Nakamura, Y.3
Kobayashi, N.4
Kimura, S.5
Nagai, R.6
-
12
-
-
0006405069
-
-
"Three-dimensional device simulator CADDETH with highly convergent matrix solution algorithms," 32, pp. 2038-2044, Oct. 1985.
-
T. Toyabe, H. Masuda, Y. Aoki, H. Shukuri, and T. Hagiwara, "Three-dimensional device simulator CADDETH with highly convergent matrix solution algorithms," IEEE Trans. Electron Devices, vol. ED-32, pp. 2038-2044, Oct. 1985.
-
IEEE Trans. Electron Devices, Vol. ED
-
-
Toyabe, T.1
Masuda, H.2
Aoki, Y.3
Shukuri, H.4
Hagiwara, T.5
-
13
-
-
0019060104
-
-
"A new method to determine MOSFET channel length," 1, pp. 170-172, Sept. 1980.
-
J. G. J. Chern, et al., "A new method to determine MOSFET channel length," IEEE Electron Device Lett., vol. EDL-1, pp. 170-172, Sept. 1980.
-
IEEE Electron Device Lett., Vol. EDL
-
-
Chern, J.G.J.1
-
14
-
-
0021501347
-
-
"The effect of high fields on MOS devices and circuit performance," 31, pp. 1386-1393, Oct. 1984.
-
C. G. Sodini, P.-K. Ko, and J. L. Moll, "The effect of high fields on MOS devices and circuit performance," IEEE Trans. Electron Devices, vol. ED-31, pp. 1386-1393, Oct. 1984.
-
IEEE Trans. Electron Devices, Vol. ED
-
-
Sodini, C.G.1
Ko, P.-K.2
Moll, J.L.3
-
15
-
-
0022009069
-
-
"Gate electrode RC delay effects in VLSI's," 20, pp. 290-294, Jan. 1985.
-
T. Sakurai and T. lizuka, "Gate electrode RC delay effects in VLSI's," IEEE J. Solid-State Circuits, vol. SSC-20, pp. 290-294, Jan. 1985.
-
IEEE J. Solid-State Circuits, Vol. SSC
-
-
Sakurai, T.1
Lizuka, T.2
|