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Volumn 46, Issue 8, 1999, Pages 1742-1748

Modeling and simulation of singleand multiple-gate 2-D MESFET's

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES CONTROL; EQUIVALENT CIRCUITS; GATES (TRANSISTOR); SCHOTTKY BARRIER DIODES;

EID: 0033169513     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.777165     Document Type: Article
Times cited : (8)

References (18)
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    • J.-Q. Lu, M. Hurt, W. C. B. Peatman, and M. S. Shur, "Heterodimensional field effect transistors for ultra low power applications," in Proc. 1998 IEEE GaAs 1C Symp., Atlanta, GA, pp. 187-190
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  • 9
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    • G. Meneghesso, A. Neviani, M. Pavesi, M. Hurt, W. C. B. Peatman, M. S. Shur, C. Canali, and E. Zanoni, "Parasitic bipolar effects leading to on-state breakdown in 2-D MESFET," in Proc. ESSDERC'97, 27th European Solid State Device Res. Conf., Stuttgart, Germany, Sept. 22-24, 1997, pp. 724-727
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.