-
1
-
-
0027887827
-
"Novel metal/2-DEG junction transistors," in
-
1993 IEEE/Cornell Conf., Ithaca, NY, pp. 314-319
-
W. C. B. Peatman, H. Park, B. Gelmont, M. S. Shur, P. Maki, E. R. Brown, and M. J. Rooks, "Novel metal/2-DEG junction transistors," in Proc. 1993 IEEE/Cornell Conf., Ithaca, NY, pp. 314-319
-
Proc.
-
-
Peatman, W.C.B.1
Park, H.2
Gelmont, B.3
Shur, M.S.4
Maki, P.5
Brown, E.R.6
Rooks, M.J.7
-
2
-
-
0029378379
-
"Novel hetero-dimensional diodes and transistors,"
-
vol. 38, no. 9, pp. 1727-1730, Sept. 1995
-
M. S. Shur, W. C. B. Peatman, H. Park, W. Grimm, and M. Hurt, "Novel hetero-dimensional diodes and transistors," Solid-State Electron., vol. 38, no. 9, pp. 1727-1730, Sept. 1995
-
Solid-State Electron.
-
-
Shur, M.S.1
Peatman, W.C.B.2
Park, H.3
Grimm, W.4
Hurt, M.5
-
3
-
-
0028460486
-
"Two-dimensional metalsemiconductor field effect transistor for ultra-low-power circuit applications,"
-
vol. 15, pp. 245-247, July 1994
-
W. C. B. Peatman, H. Park, and M. S. Shur, "Two-dimensional metalsemiconductor field effect transistor for ultra-low-power circuit applications," IEEE Electron Device Lett., vol. 15, pp. 245-247, July 1994
-
IEEE Electron Device Lett.
-
-
Peatman, W.C.B.1
Park, H.2
Shur, M.S.3
-
4
-
-
0029379445
-
"Narrow channel 2-D MESFET for low-power electronics,"
-
vol. 42, pp. 1569-1573, Sept. 1995
-
W. C. B. Peatman, M. J. Hurt, H. Park, T. Ytterdal, R. Tsai, and M. S. Shur, "Narrow channel 2-D MESFET for low-power electronics," IEEE Trans. Electron Devices, vol. 42, pp. 1569-1573, Sept. 1995
-
IEEE Trans. Electron Devices
-
-
Peatman, W.C.B.1
Hurt, M.J.2
Park, H.3
Ytterdal, T.4
Tsai, R.5
Shur, M.S.6
-
5
-
-
0030085794
-
"Sub-half-micrometer width 2-D MESFET,"
-
vol. 17, pp. 4CM2, Feb. 1996
-
W. C. B. Peatman, R. Tsai, T. Ytterdal, M. Hurt, H. Park, J. Gonzales, and M. S. Shur, "Sub-half-micrometer width 2-D MESFET," IEEE Electron Device Lett., vol. 17, pp. 4CM2, Feb. 1996
-
IEEE Electron Device Lett.
-
-
Peatman, W.C.B.1
Tsai, R.2
Ytterdal, T.3
Hurt, M.4
Park, H.5
Gonzales, J.6
Shur, M.S.7
-
6
-
-
0032309908
-
"Heterodimensional field effect transistors for ultra low power applications," in
-
1998 IEEE GaAs 1C Symp., Atlanta, GA, pp. 187-190
-
J.-Q. Lu, M. Hurt, W. C. B. Peatman, and M. S. Shur, "Heterodimensional field effect transistors for ultra low power applications," in Proc. 1998 IEEE GaAs 1C Symp., Atlanta, GA, pp. 187-190
-
Proc.
-
-
Lu, J.-Q.1
Hurt, M.2
Peatman, W.C.B.3
Shur, M.S.4
-
7
-
-
0031175953
-
"RTD/2-D MESFET/RTD logic elements for compact, ultralow-power electronics,"
-
vol. 44, pp. 1033-1039, July 1997.
-
J. Robertson, T. Ytterdal, W. C. B. Peatman, R. Tsai, E. Brown, and M. S. Shur, "RTD/2-D MESFET/RTD logic elements for compact, ultralow-power electronics," IEEE Trans. Electron Devices, vol. 44, pp. 1033-1039, July 1997.
-
IEEE Trans. Electron Devices
-
-
Robertson, J.1
Ytterdal, T.2
Peatman, W.C.B.3
Tsai, R.4
Brown, E.5
Shur, M.S.6
-
8
-
-
0029489371
-
"Transport characterization of Schottky in-plane gate Alo.sGao.yAs/GaAs quantum wire transistors,"
-
1, vol. 34, no. 12B, 1995.
-
H. Okidata, T. Hashizume, and H. Hasegawa, "Transport characterization of Schottky in-plane gate Alo.sGao.yAs/GaAs quantum wire transistors," Jpn. J. Appl. Phys., pt. 1, vol. 34, no. 12B, 1995.
-
Jpn. J. Appl. Phys., Pt.
-
-
Okidata, H.1
Hashizume, T.2
Hasegawa, H.3
-
9
-
-
33747152369
-
"Parasitic bipolar effects leading to on-state breakdown in 2-D MESFET," in
-
97, 27th European Solid State Device Res. Conf., Stuttgart, Germany, Sept. 22-24, 1997, pp. 724-727
-
G. Meneghesso, A. Neviani, M. Pavesi, M. Hurt, W. C. B. Peatman, M. S. Shur, C. Canali, and E. Zanoni, "Parasitic bipolar effects leading to on-state breakdown in 2-D MESFET," in Proc. ESSDERC'97, 27th European Solid State Device Res. Conf., Stuttgart, Germany, Sept. 22-24, 1997, pp. 724-727
-
Proc. ESSDERC'
-
-
Meneghesso, G.1
Neviani, A.2
Pavesi, M.3
Hurt, M.4
Peatman, W.C.B.5
Shur, M.S.6
Canali, C.7
Zanoni, E.8
-
10
-
-
84866814241
-
"Study of breakdown mechanism in 2-D MESFET," in
-
97, 21th European Workshop on Compound Semiconductor Devices and Integrated Circuits, Scheveningen, The Netherlands, May 25-28, 1997, pp. 21-22
-
G. Meneghesso, G. Peloso, A. Neviani, M. Hurt, W. C. B. Peatman, M. S. Shur, and E. Zanoni, "Study of breakdown mechanism in 2-D MESFET," in Proc. WOCSDICE'97, 21th European Workshop on Compound Semiconductor Devices and Integrated Circuits, Scheveningen, The Netherlands, May 25-28, 1997, pp. 21-22
-
Proc. WOCSDICE'
-
-
Meneghesso, G.1
Peloso, G.2
Neviani, A.3
Hurt, M.4
Peatman, W.C.B.5
Shur, M.S.6
Zanoni, E.7
-
11
-
-
0032136677
-
"Breakdown behavior of low power pseudomorphic AlGaAs/InGaAs 2-D MESFET's,"
-
vol. 45, pp. 1843-1845, Aug. 1998
-
M. J. Hurt, G. Meneghesso, E. Zanoni, W. C. B. Peatman, R. Tsai, and M. S. Shur, "Breakdown behavior of low power pseudomorphic AlGaAs/InGaAs 2-D MESFET's," IEEE Trans. Electron Devices, vol. 45, pp. 1843-1845, Aug. 1998
-
IEEE Trans. Electron Devices
-
-
Hurt, M.J.1
Meneghesso, G.2
Zanoni, E.3
Peatman, W.C.B.4
Tsai, R.5
Shur, M.S.6
-
12
-
-
0030379861
-
"The optoelectronic response of laterally-contacted 2-D MESFET,"
-
vol. 43, pp. 2300-2301, Dec. 1996
-
R. Tsai, F. Schuermeyer, W. Peatman, and M. S. Shur, "The optoelectronic response of laterally-contacted 2-D MESFET," IEEE Trans. Electron Devices, vol. 43, pp. 2300-2301, Dec. 1996
-
IEEE Trans. Electron Devices
-
-
Tsai, R.1
Schuermeyer, F.2
Peatman, W.3
Shur, M.S.4
-
13
-
-
0032284102
-
"Device design considerations for double-gate, ground-plane and single-gated ultrathin SOI MOSFET's at the 25-nm gate length generation," in
-
98, San Francisco, CA, Dec. 1998, pp. 407-410
-
H. Wong, D. Frank, and P. Solomon, "Device design considerations for double-gate, ground-plane and single-gated ultrathin SOI MOSFET's at the 25-nm gate length generation," in Proc. IEDM'98, San Francisco, CA, Dec. 1998, pp. 407-410
-
Proc. IEDM'
-
-
Wong, H.1
Frank, D.2
Solomon, P.3
-
15
-
-
33747138042
-
-
K. Lee, M. S. Shur, T. A. Fjeldly, and T. Ytterdal, Semiconductor Device Modeling for VLSI. Englewood Cliff, NJ: Prentice-Hall, 1993
-
Semiconductor Device Modeling for VLSI. Englewood Cliff, NJ: Prentice-Hall, 1993
-
-
Lee, K.1
Shur, M.S.2
Fjeldly, T.A.3
Ytterdal, T.4
-
16
-
-
84866812913
-
-
AIM-SPICE World Wide Web site: www.aimspice.com
-
-
-
-
17
-
-
0026869450
-
"Theory of junction between two-dimensional electron gas and p-type semiconductor,"
-
vol. 39, pp. 1216-1222, May 1992
-
B. Gelmont, M. S. Shur, and C. Moglestue, "Theory of junction between two-dimensional electron gas and p-type semiconductor," IEEE Trans. Electron Devices, vol. 39, pp. 1216-1222, May 1992
-
IEEE Trans. Electron Devices
-
-
Gelmont, B.1
Shur, M.S.2
Moglestue, C.3
-
18
-
-
0029393045
-
-
vol. 42, pp. 1724-1734, Oct. 1995.
-
T. Ytterdal, B.-J. Moon, T. A. Fjeldly, and M. S. Shur," "Enhanced GaAs MESFET CAD model for a wide range of temperatures," IEEE Trans. Electron Devices, vol. 42, pp. 1724-1734, Oct. 1995.
-
IEEE Trans. Electron Devices
-
-
Ytterdal, T.1
Moon, B.-J.2
Fjeldly, T.A.3
Shur, M.S.4
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