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Volumn 43, Issue 12, 1996, Pages 2300-2301

The optoelectronic response of a laterally contacted 2-D MESFET

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; ELECTRON TRANSPORT PROPERTIES; FREQUENCY RESPONSE; GATES (TRANSISTOR); HETEROJUNCTIONS; OPTICAL VARIABLES MEASUREMENT; OPTOELECTRONIC DEVICES; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICA; THIN FILMS;

EID: 0030379861     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.544424     Document Type: Article
Times cited : (4)

References (9)
  • 8
    • 33747674073 scopus 로고    scopus 로고
    • MBE wafer and van per Pauw data provided by Quantum Epitaxial Designs, Inc., Bethlehem, PA.
    • MBE wafer and van per Pauw data provided by Quantum Epitaxial Designs, Inc., Bethlehem, PA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.