Dielectric versus topographic contrast in near-field microscopy

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 13, Issue 9, 1996, Pages 1801-1808

  Martin, Olivier J F ^a   Girard, Christian ^b   Dereux, Alain ^c  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^c UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BURIED WAVEGUIDES; DIELECTRIC CONTRAST; LOCAL INDEX VARIATIONS; PHOTONIC INTEGRATED CIRCUITS; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TOPOGRAPHIC CONTRAST;

DIELECTRIC MATERIALS; ELECTRIC FIELDS; GREEN'S FUNCTION; IMAGE ANALYSIS; INTEGRATED OPTOELECTRONICS; NUMERICAL ANALYSIS; OPTICAL WAVEGUIDES; POLARIZATION; REFRACTIVE INDEX; SURFACES;

OPTICAL MICROSCOPY;

EID: 0030241056     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.13.001801     Document Type: Article

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