Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

Journal of Applied Physics

Volumn 83, Issue 3, 1998, Pages 1171-1176

  Durkan, C ^a,b   Shvets, I V ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT POLARIZATION; LIGHT REFLECTION; MAGNETOOPTICAL EFFECTS; MIRRORS; PHOTOMULTIPLIERS; SCANNING;

LIGHT DETECTION; OPTICAL CONTRAST; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032001891     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366812     Document Type: Article

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