Observation and analysis of near-field optical diffraction

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 16, Issue 1, 1999, Pages 141-148

  Huser, Th ^a   Novotny, L ^b   Lacoste, Th ^a   Eckert, R ^a   Heinzelmann, H ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC PROPERTIES; IMAGE ANALYSIS; LIGHT EMISSION; LIGHT POLARIZATION; LIGHT REFLECTION; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; PROBES; SUBSTRATES;

IMAGE ANALYSIS; LIGHT INTENSITY; MULTIPLE-MULTIPOLE METHOD; NEAR FIELD DIFFRACTION;

DIFFRACTION;

EID: 0032607736     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.16.000141     Document Type: Article

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