Influence of detection conditions on near-field optical imaging

Journal of Applied Physics

Volumn 84, Issue 11, 1998, Pages 5873-5882

  Hecht, B ^a,d   Bielefeldt, H ^a,e   Pohl, D W ^a   Novotny, L ^b   Heinzelmann, H ^c  

^a IBM RESEARCH ZURICH   (Switzerland)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF BASEL   (Switzerland)

^d ETH ZURICH   (Switzerland)

^e UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; DIFFRACTION GRATINGS; FOURIER TRANSFORMS; LIGHT POLARIZATION; LIGHT TRANSMISSION; MICROSCOPES; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTICAL RESOLVING POWER; PHOTOMULTIPLIERS; REFRACTIVE INDEX;

IMAGE FORMATION; LIGHT DETECTION; LIGHT FLUX; SCANNING NEAR FIELD OPTICAL; TOPOGRAPHIC PROPERTIES;

IMAGE PROCESSING;

EID: 0032340146     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368902     Document Type: Article

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