Risk assessment for heavy ions of parts tested with protons

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2311-2314

  O'Neill, P M ^a,b   Badhwar, G D ^a,b   Culpepper, W X ^a,b  

^a IEEE   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY ION; PROTON; SILICON;

ARTICLE; COMPUTER SIMULATION; ELECTRONICS; ELEMENTARY PARTICLE; EQUIPMENT; LINEAR ENERGY TRANSFER; MONTE CARLO METHOD; NASA CENTER JSC; NASA DISCIPLINE RADIATION HEALTH; NUCLEAR PHYSICS; RISK ASSESSMENT; SPACE FLIGHT; THEORETICAL MODEL;

NASA CENTER JSC; NASA DISCIPLINE RADIATION HEALTH;

COMPUTER SIMULATION; ELECTRONICS; ELEMENTARY PARTICLE INTERACTIONS; EQUIPMENT FAILURE; HEAVY IONS; LINEAR ENERGY TRANSFER; MODELS, THEORETICAL; MONTE CARLO METHOD; NUCLEAR PHYSICS; PROTONS; RISK ASSESSMENT; SILICON; SPACE FLIGHT;

COMPUTER SIMULATION; COMPUTER SOFTWARE; ENERGY TRANSFER; IONS; PROTONS; RISK ASSESSMENT; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE TESTING;

ENERGY DEPOSITION; LINEAR ENERGY TRANSFER (LET);

MICROELECTRONICS;

EID: 0031290198     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659052     Document Type: Article

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