Charge transfer efficiency in proton damaged CCD's

IEEE Transactions on Nuclear Science

Volumn 45, Issue 2, 1998, Pages 154-163

  Hardy, T ^a,b   Murowinski, R ^a   Deen, M J ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Ccd's; Charge transfer efficiency; Imaging detectors; Proton damage; Radiation

Indexed keywords

CHARGE TRANSFER; COMPUTER SIMULATION; FUNCTIONS; MATHEMATICAL MODELS; PROTONS; RADIATION DAMAGE;

CHARGE DISTRIBUTION; CHARGE TRANSFER EFFICIENCY (CTE); IMAGING DETECTORS;

CHARGE COUPLED DEVICES;

EID: 0032047627     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.664167     Document Type: Article

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