The Quantitative Effects of Interface States on the Performance of Charge-Coupled Devices

IEEE Transactions on Electron Devices

Volumn 20, Issue 1, 1973, Pages 45-55

  Tompsett, Michael F ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

SEMICONDUCTOR DEVICES;

EID: 0015555198     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1973.17607     Document Type: Article

References (20)

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3. M. F. Tompsett, G. F. Amelio, W. J. Bertram, Jr., R. R. Buck-Ley, W. J. McNamara, J. C. Mikkelsen, Jr., and D. A. Sealer, “Charge-coupled imaging devices: Experimental results,” IEEE Trans. Electron Devices, vo1. ED-18, pp. 992–996, Nov. 1971.
4. C. H. Séquin et al., “A 500-element three-phase charge coupled device,” unpublished.
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