The physics of radiation damage in particle detectors

Nuclear Inst. and Methods in Physics Research, A

Volumn 253, Issue 3, 1987, Pages 453-459

  Van Lint, Victor A J ^a  

^a MISSION RESEARCH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION; PARTICLE BEAMS; SEMICONDUCTOR DEVICES;

SEMICONDUCTOR DETECTORS; SIGNAL-CONDITIONING ELECTRONICS;

PARTICLE DETECTORS;

EID: 0022436566     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(87)90532-8     Document Type: Article

References (13)

1. Energy Dependence of Displacement Effects in Semiconductors
2. Correlation of Displacement Effects Produced by Electrons Protons and Neutrons in Silicon
3. Processing Effects on Steam Oxide Hardness
4. Process Controls for Radiation-Hardened Aluminum Gate Bulk Silicon CMOS
5. Total Dose Effects in Recessed Oxide Digital Bipolar Microcircuits
6. Effects of ionizing radiation on charge-coupled device structures