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Volumn 17, Issue 4, 1998, Pages 324-332

The path-status graph with application to delay fault simulation

Author keywords

Delay testing; Fault simulation; Path delay fault

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DATA STRUCTURES; GRAPH THEORY;

EID: 0032044561     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.703822     Document Type: Article
Times cited : (27)

References (21)
  • 4
    • 0027812826 scopus 로고    scopus 로고
    • Path delay fault simulation of sequential circuits,"
    • pp. 453-461, Dec. 1993.
    • S. Bose, P. Agrawal, and V. D. Agrawal, Path delay fault simulation of sequential circuits," Trans. VLSI Syst.. vol. 1, pp. 453-461, Dec. 1993.
    • Trans. VLSI Syst.. Vol. 1
    • Bose, S.1    Agrawal, P.2    Agrawal, V.D.3
  • 5
    • 0028374730 scopus 로고    scopus 로고
    • SPADES-ACE: A simulator for path delay faults in sequential circuits with extensions to arbitrary clocking schemes,"
    • pp. 251-263, Feb. 1994.
    • I. Pomeranz and S. M. Reddy, SPADES-ACE: A simulator for path delay faults in sequential circuits with extensions to arbitrary clocking schemes," IEEE Trans. Computer-Aided Design, vol. 13, pp. 251-263, Feb. 1994.
    • IEEE Trans. Computer-Aided Design, Vol. 13
    • Pomeranz, I.1    Reddy, S.M.2
  • 10
    • 0031095781 scopus 로고    scopus 로고
    • Nonenumerative path delay fault coverage estimation based on optimal polynomial time algorithms,"
    • pp. 309-315, Mar. 1997.
    • D. Kagaris, S. Tragoudas, and D. Karayiannis, Nonenumerative path delay fault coverage estimation based on optimal polynomial time algorithms," IEEE Trans. Computer-Aided Design, vol. 16, pp. 309-315, Mar. 1997.
    • IEEE Trans. Computer-Aided Design, Vol. 16
    • Kagaris, D.1    Tragoudas, S.2    Karayiannis, D.3
  • 14
    • 0031210023 scopus 로고    scopus 로고
    • Classification and test generation of path-delay faults using single stuck-at fault tests,"
    • pp. 55-67, 1997. Also in Proc. IEEE Int. Test Conf., Oct. 1995, pp. 139-148.
    • M. A. Gharaybeh, M. L. Bushnell, and V. D. Agrawal, Classification and test generation of path-delay faults using single stuck-at fault tests," J. Electron. Testing: Theory Appl., vol. 11, no. 1, pp. 55-67, 1997. Also in Proc. IEEE Int. Test Conf., Oct. 1995, pp. 139-148.
    • J. Electron. Testing: Theory Appl., Vol. 11 , Issue.1
    • Gharaybeh, M.A.1    Bushnell, M.L.2    Agrawal, V.D.3
  • 16
    • 0029697596 scopus 로고    scopus 로고
    • Parallel pattern concurrent fault simulation of path-delay faults with single-input change tests," in
    • 1996, pp. 426-431.
    • M. A. Gharaybeh, M. L. Bushnell, and V. D. Agrawal, Parallel pattern concurrent fault simulation of path-delay faults with single-input change tests," in Proc. 9th Int. Conf. VLSI Design, Jan. 1996, pp. 426-431.
    • Proc. 9th Int. Conf. VLSI Design, Jan.
    • Gharaybeh, M.A.1    Bushnell, M.L.2    Agrawal, V.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.