-
1
-
-
0026961377
-
DynaTAPP: Dynamic timing analysis with partial path activation in sequential circuits
-
Sept.
-
P. Agrawal, V.D. Agrawal, and S.C. Seth, “DynaTAPP: Dynamic timing analysis with partial path activation in sequential circuits,” in Proc. European Design Automat. Conf., Sept. 1992, pp. 138–141.
-
(1992)
Proc. European Design Automat. Conf.
, pp. 138-141
-
-
Agrawal, P.1
Agrawal, V.D.2
Seth, S.C.3
-
2
-
-
0027553532
-
Generating tests for delay faults in non-scan circuits
-
Mar.
-
P. Agrawal, V.D. Agrawal, and S.C. Seth, “Generating tests for delay faults in non-scan circuits,” IEEE Design Test Comput., vol. 10, pp. 20–28, Mar. 1993.
-
(1993)
IEEE Design Test Comput.
, vol.10
, pp. 20-28
-
-
Agrawal, P.1
Agrawal, V.D.2
Seth, S.C.3
-
3
-
-
8444240324
-
A path delay fault simulator for sequential circuits
-
Jan.
-
S. Bose, P. Agrawal, and V.D. Agrawal, “A path delay fault simulator for sequential circuits,” in Proc. Sixth Int. Conf. VLSI Design, Jan. 1993, pp. 269–274.
-
(1993)
Proc. Sixth Int. Conf. VLSI Design
, pp. 269-274
-
-
Bose, S.1
Agrawal, P.2
Agrawal, V.D.3
-
4
-
-
0027646556
-
The optimistic update theorem for path delay fault testing
-
Aug.
-
S. Bose, P. Agrawal, and V.D. Agrawal, “The optimistic update theorem for path delay fault testing,” J. Electron. Test.: Theory and Applic., vol. 4, pp. 285–290, Aug. 1993.
-
(1993)
J. Electron. Test.: Theory and Applic.
, vol.4
, pp. 285-290
-
-
Bose, S.1
Agrawal, P.2
Agrawal, V.D.3
-
5
-
-
0026986184
-
Delay fault models and test generation for random logic sequential circuits
-
June
-
T.J. Chakraborty, V.D. Agrawal, and M.L. Bushnell, “Delay fault models and test generation for random logic sequential circuits,” in Proc. Design Automat. Conf., June 1992, pp. 165–172.
-
(1992)
Proc. Design Automat. Conf.
, pp. 165-172
-
-
Chakraborty, T.J.1
Agrawal, V.D.2
Bushnell, M.L.3
-
6
-
-
2342603357
-
Path delay fault simulation algorithms for sequential circuits
-
Nov.
-
T.J. Chakraborty, V.D. Agrawal, and M.L. Bushnell, “Path delay fault simulation algorithms for sequential circuits,” in Proc. Asian Test Symp., Nov. 1992, pp. 52–56.
-
(1992)
Proc. Asian Test Symp.
, pp. 52-56
-
-
Chakraborty, T.J.1
Agrawal, V.D.2
Bushnell, M.L.3
-
7
-
-
0024915805
-
Delay test generation for synchronous sequential circuits
-
S. Devadas, “Delay test generation for synchronous sequential circuits,” in Proc. Int. Test Conf., 1989, pp. 144–152.
-
(1989)
Proc. Int. Test Conf.
, pp. 144-152
-
-
Devadas, S.1
-
8
-
-
0026238696
-
DYNAMITE: An efficient automatic test pattern generation system for path delay faults
-
Oct.
-
K. Fuchs, F. Fink, and M.H. Schulz, “DYNAMITE: An efficient automatic test pattern generation system for path delay faults,” IEEE Trans. Comput.-Aided Design, vol. 10, pp. 1323–1335, Oct. 1991.
-
(1991)
IEEE Trans. Comput.-Aided Design
, vol.10
, pp. 1323-1335
-
-
Fuchs, K.1
Fink, F.2
Schulz, M.H.3
-
10
-
-
0026962075
-
SPADES: A simulator for path delay faults in sequential circuits
-
Sept.
-
I. Pomeranz, L.N. Reddy, and S.M. Reddy, “SPADES: A simulator for path delay faults in sequential circuits,” in Proc. European Design Automat. Conf., Sept. 1992, pp. 428–435.
-
(1992)
Proc. European Design Automat. Conf.
, pp. 428-435
-
-
Pomeranz, I.1
Reddy, L.N.2
Reddy, S.M.3
-
11
-
-
0022307908
-
Model for delay faults based upon paths
-
Sept.
-
G.L. Smith, “Model for delay faults based upon paths,” in Proc. Int. Test Conf., Sept. 1985, pp. 342–349.
-
(1985)
Proc. Int. Test Conf.
, pp. 342-349
-
-
Smith, G.L.1
|