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Volumn 1, Issue 4, 1993, Pages 453-461

Path Delay Fault Simulation of Sequential Circuits

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FAULT LOCATION; ERROR ANALYSIS; FLIP FLOP CIRCUITS; HAZARDS AND RACE CONDITIONS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; STATE ASSIGNMENT; VECTORS;

EID: 0027812826     PISSN: 10638210     EISSN: 15579999     Source Type: Journal    
DOI: 10.1109/92.250193     Document Type: Article
Times cited : (18)

References (11)
  • 1
    • 0026961377 scopus 로고
    • DynaTAPP: Dynamic timing analysis with partial path activation in sequential circuits
    • Sept.
    • P. Agrawal, V.D. Agrawal, and S.C. Seth, “DynaTAPP: Dynamic timing analysis with partial path activation in sequential circuits,” in Proc. European Design Automat. Conf., Sept. 1992, pp. 138–141.
    • (1992) Proc. European Design Automat. Conf. , pp. 138-141
    • Agrawal, P.1    Agrawal, V.D.2    Seth, S.C.3
  • 2
    • 0027553532 scopus 로고
    • Generating tests for delay faults in non-scan circuits
    • Mar.
    • P. Agrawal, V.D. Agrawal, and S.C. Seth, “Generating tests for delay faults in non-scan circuits,” IEEE Design Test Comput., vol. 10, pp. 20–28, Mar. 1993.
    • (1993) IEEE Design Test Comput. , vol.10 , pp. 20-28
    • Agrawal, P.1    Agrawal, V.D.2    Seth, S.C.3
  • 4
    • 0027646556 scopus 로고
    • The optimistic update theorem for path delay fault testing
    • Aug.
    • S. Bose, P. Agrawal, and V.D. Agrawal, “The optimistic update theorem for path delay fault testing,” J. Electron. Test.: Theory and Applic., vol. 4, pp. 285–290, Aug. 1993.
    • (1993) J. Electron. Test.: Theory and Applic. , vol.4 , pp. 285-290
    • Bose, S.1    Agrawal, P.2    Agrawal, V.D.3
  • 5
    • 0026986184 scopus 로고
    • Delay fault models and test generation for random logic sequential circuits
    • June
    • T.J. Chakraborty, V.D. Agrawal, and M.L. Bushnell, “Delay fault models and test generation for random logic sequential circuits,” in Proc. Design Automat. Conf., June 1992, pp. 165–172.
    • (1992) Proc. Design Automat. Conf. , pp. 165-172
    • Chakraborty, T.J.1    Agrawal, V.D.2    Bushnell, M.L.3
  • 6
    • 2342603357 scopus 로고
    • Path delay fault simulation algorithms for sequential circuits
    • Nov.
    • T.J. Chakraborty, V.D. Agrawal, and M.L. Bushnell, “Path delay fault simulation algorithms for sequential circuits,” in Proc. Asian Test Symp., Nov. 1992, pp. 52–56.
    • (1992) Proc. Asian Test Symp. , pp. 52-56
    • Chakraborty, T.J.1    Agrawal, V.D.2    Bushnell, M.L.3
  • 7
    • 0024915805 scopus 로고
    • Delay test generation for synchronous sequential circuits
    • S. Devadas, “Delay test generation for synchronous sequential circuits,” in Proc. Int. Test Conf., 1989, pp. 144–152.
    • (1989) Proc. Int. Test Conf. , pp. 144-152
    • Devadas, S.1
  • 8
    • 0026238696 scopus 로고
    • DYNAMITE: An efficient automatic test pattern generation system for path delay faults
    • Oct.
    • K. Fuchs, F. Fink, and M.H. Schulz, “DYNAMITE: An efficient automatic test pattern generation system for path delay faults,” IEEE Trans. Comput.-Aided Design, vol. 10, pp. 1323–1335, Oct. 1991.
    • (1991) IEEE Trans. Comput.-Aided Design , vol.10 , pp. 1323-1335
    • Fuchs, K.1    Fink, F.2    Schulz, M.H.3
  • 9
    • 84939371489 scopus 로고
    • On delay testing in logic circuits
    • Sept.
    • C.J. Lin and S.M. Reddy, “On delay testing in logic circuits,” IEEE Trans. Comput.-Aided Design, vol. 6, pp. 694–701, Sept. 1987.
    • (1987) IEEE Trans. Comput.-Aided Design , vol.6 , pp. 694-701
    • Lin, C.J.1    Reddy, S.M.2
  • 10
    • 0026962075 scopus 로고
    • SPADES: A simulator for path delay faults in sequential circuits
    • Sept.
    • I. Pomeranz, L.N. Reddy, and S.M. Reddy, “SPADES: A simulator for path delay faults in sequential circuits,” in Proc. European Design Automat. Conf., Sept. 1992, pp. 428–435.
    • (1992) Proc. European Design Automat. Conf. , pp. 428-435
    • Pomeranz, I.1    Reddy, L.N.2    Reddy, S.M.3
  • 11
    • 0022307908 scopus 로고
    • Model for delay faults based upon paths
    • Sept.
    • G.L. Smith, “Model for delay faults based upon paths,” in Proc. Int. Test Conf., Sept. 1985, pp. 342–349.
    • (1985) Proc. Int. Test Conf. , pp. 342-349
    • Smith, G.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.