Exact non-enumerative fault simulator for path-delay faults

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 276-285

  Gharaybeh, Marwan A ^a   Bushnell, Michael L ^a   Agrawal, Vishwani D ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DATA STRUCTURES; ELECTRIC FAULT CURRENTS;

NONENUMERATIVE FAULT SIMULATOR; PATH DELAY FAULTS; PATH STATUS GRAPH (PSG);

INTEGRATED CIRCUIT TESTING;

EID: 0030413787     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)