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Volumn , Issue , 1985, Pages 342-349
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MODEL FOR DELAY FAULTS BASED UPON PATHS.
a
a
IBM
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMBINATIONAL LOGIC;
DELAY FAULTS;
LOGIC CIRCUIT FAULT DIAGNOSIS;
LOGIC CIRCUITS, COMBINATORIAL;
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EID: 0022307908
PISSN: 07431686
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (461)
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References (7)
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