-
1
-
-
0021521388
-
Modeling and testing for timing faults in synchronous sequential circuits
-
Nov.
-
Y. K. Malaviya and R. Narayanaswamy, “Modeling and testing for timing faults in synchronous sequential circuits,” IEEE Design & Test of Computers, pp. 62–74, Nov. 1984.
-
(1984)
IEEE Design and Test of Computers
, pp. 62-74
-
-
Malaviya, Y.K.1
Narayanaswamy, R.2
-
2
-
-
0024915805
-
Delay test generation for synchronous sequential circuits
-
S. Devadas, “Delay test generation for synchronous sequential circuits,” in Proc. Int. Test Conf., 1989, pp. 144–152.
-
(1989)
Proc. Int. Test Conf.
, pp. 144-152
-
-
Devadas, S.1
-
3
-
-
0022307908
-
Model for delay faults based upon paths
-
Nov.
-
G. L. Smith, “Model for delay faults based upon paths,” in Proc. Int. Test Conf, Nov. 1985, pp. 342–349.
-
(1985)
Proc. Int. Test Conf
, pp. 342-349
-
-
Smith, G.L.1
-
4
-
-
0022880990
-
Random pattern testability of delay faults
-
Sept.
-
J. Savir and W. H. McAnney, “Random pattern testability of delay faults,” in Proc. Int. Test Conf, Sept. 1986, pp. 263–273.
-
(1986)
Proc. Int. Test Conf
, pp. 263-273
-
-
Savir, J.1
McAnney, W.H.2
-
6
-
-
0021199436
-
Robust tests for stuck-open open faults in CMOS combinational logic circuits
-
Florida, June
-
S. M. Reddy, M. K. Reddy, and V. D. Agrawal, “Robust tests for stuck-open open faults in CMOS combinational logic circuits,” in Proc. Int. Symp. on Fault-Tolerant Computing, Florida, June 1984, pp. 44–49.
-
(1984)
Proc. Int. Symp. on Fault-Tolerant Computing
, pp. 44-49
-
-
Reddy, S.M.1
Reddy, M.K.2
Agrawal, V.D.3
-
7
-
-
0023601226
-
Robust and nonrobust tests for path delay faults in a combinational logic
-
Sept.
-
E. S. Park and M. R. Mercer, “Robust and nonrobust tests for path delay faults in a combinational logic,” in Proc. Int. Test Conf, Sept. 1987, pp. 1027–1034.
-
(1987)
Proc. Int. Test Conf
, pp. 1027
-
-
Park, E.S.1
Mercer, M.R.2
-
8
-
-
0024920874
-
Advanced automatic test pattern generation techniques for path delay faults
-
June
-
M. H. Schulz, K. Fuchs, and F. Fink, “Advanced automatic test pattern generation techniques for path delay faults”, in Proc. 19th Fault-Tolerant Computing Symp., June 1989, pp. 44–51.
-
(1989)
Proc. 19th Fault-Tolerant Computing Symp.
, pp. 44-51
-
-
Schulz, M.H.1
Fuchs, K.2
Fink, F.3
-
9
-
-
0026973230
-
At-speed testing of synchronous sequential circuits
-
I. Pomeranz and S. M. Reddy, “At-speed testing of synchronous sequential circuits”, in Proc. 29th Design Autom. Conf, 1992, pp. 177–181.
-
(1992)
Proc. 29th Design Autom. Conf
, pp. 177-181
-
-
Pomeranz, I.1
Reddy, S.M.2
-
10
-
-
0002609165
-
A neutral netlist of 10 combinational benchmark designs and a special translator in Fortran
-
June
-
F. Brglez and H. Fujiwara, “A neutral netlist of 10 combinational benchmark designs and a special translator in Fortran,” in Proc. Int. Symp. Circuits and Systems, June 1985.
-
(1985)
Proc. Int. Symp. Circuits and Systems
-
-
Brglez, F.1
Fujiwara, H.2
-
11
-
-
0024913805
-
Combinational profiles of sequential benchmark circuits
-
May
-
F. Brglez et. al., “Combinational profiles of sequential benchmark circuits,” in Proc. Int. Symp. Circuits and Systems, May 1989, pp. 1929–1934.
-
(1989)
Proc. Int. Symp. Circuits and Systems
, pp. 1929-1934
-
-
Brglez, F.1
-
13
-
-
0003726110
-
Hazard detection in combination and sequential circuits
-
Mar.
-
E. B. Eichelberger, “Hazard detection in combination and sequential circuits,” IBM J. Res. Devel., pp. 90–99, Mar. 1965.
-
(1965)
IBM J. Res. Devel.
, pp. 90-99
-
-
Eichelberger, E.B.1
-
14
-
-
0026992429
-
An efficient nonenumerative method to estimate path delay fault coverage
-
Nov.
-
I. Pomeranz and S. M. Reddy, “An efficient nonenumerative method to estimate path delay fault coverage,” in Proc. Int. Conf. Computer-Aided Design, Nov. 1992, pp. 560–567.
-
(1992)
Proc. Int. Conf. Computer-Aided Design
, pp. 560-567
-
-
Pomeranz, I.1
Reddy, S.M.2
-
15
-
-
0026962075
-
SPADES: A simulator for path delay faults in sequential circuits
-
Sept.
-
I. Pomeranz, L. N. Reddy, and S. M. Reddy, “SPADES: A simulator for path delay faults in sequential circuits,” in Proc. EURO-DAC ‘92, Sept. 1992, pp. 428–435.
-
(1992)
Proc. EURO-DAC '92
, pp. 428-435
-
-
Pomeranz, I.1
Reddy, L.N.2
Reddy, S.M.3
|