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Volumn 13, Issue 2, 1994, Pages 251-263

SPADES-ACE: A Simulator for Path Delay Faults in Sequential Circuits with Extensions to Arbitrary Clocking Schemes

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CLOCKS; ELECTRIC FAULT LOCATION; FLIP FLOP CIRCUITS; RANDOM PROCESSES; SEQUENTIAL CIRCUITS; SIMULATORS; STATE ASSIGNMENT; TIMING CIRCUITS; TRANSIENTS;

EID: 0028374730     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.259948     Document Type: Article
Times cited : (11)

References (15)
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    • Malaviya, Y.K.1    Narayanaswamy, R.2
  • 2
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    • Delay test generation for synchronous sequential circuits
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  • 3
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    • Model for delay faults based upon paths
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    • G. L. Smith, “Model for delay faults based upon paths,” in Proc. Int. Test Conf, Nov. 1985, pp. 342–349.
    • (1985) Proc. Int. Test Conf , pp. 342-349
    • Smith, G.L.1
  • 4
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    • Random pattern testability of delay faults
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    • J. Savir and W. H. McAnney, “Random pattern testability of delay faults,” in Proc. Int. Test Conf, Sept. 1986, pp. 263–273.
    • (1986) Proc. Int. Test Conf , pp. 263-273
    • Savir, J.1    McAnney, W.H.2
  • 5
    • 84939371489 scopus 로고
    • On delay fault testing in logic circuits
    • Sept.
    • C. J. Lin and S. M. Reddy, “On delay fault testing in logic circuits,” IEEE Trans. Computer-Aided Design, pp. 694–703, Sept. 1987.
    • (1987) IEEE Trans. Computer-Aided Design , pp. 694-703
    • Lin, C.J.1    Reddy, S.M.2
  • 6
    • 0021199436 scopus 로고
    • Robust tests for stuck-open open faults in CMOS combinational logic circuits
    • Florida, June
    • S. M. Reddy, M. K. Reddy, and V. D. Agrawal, “Robust tests for stuck-open open faults in CMOS combinational logic circuits,” in Proc. Int. Symp. on Fault-Tolerant Computing, Florida, June 1984, pp. 44–49.
    • (1984) Proc. Int. Symp. on Fault-Tolerant Computing , pp. 44-49
    • Reddy, S.M.1    Reddy, M.K.2    Agrawal, V.D.3
  • 7
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    • Robust and nonrobust tests for path delay faults in a combinational logic
    • Sept.
    • E. S. Park and M. R. Mercer, “Robust and nonrobust tests for path delay faults in a combinational logic,” in Proc. Int. Test Conf, Sept. 1987, pp. 1027–1034.
    • (1987) Proc. Int. Test Conf , pp. 1027
    • Park, E.S.1    Mercer, M.R.2
  • 8
    • 0024920874 scopus 로고
    • Advanced automatic test pattern generation techniques for path delay faults
    • June
    • M. H. Schulz, K. Fuchs, and F. Fink, “Advanced automatic test pattern generation techniques for path delay faults”, in Proc. 19th Fault-Tolerant Computing Symp., June 1989, pp. 44–51.
    • (1989) Proc. 19th Fault-Tolerant Computing Symp. , pp. 44-51
    • Schulz, M.H.1    Fuchs, K.2    Fink, F.3
  • 9
    • 0026973230 scopus 로고
    • At-speed testing of synchronous sequential circuits
    • I. Pomeranz and S. M. Reddy, “At-speed testing of synchronous sequential circuits”, in Proc. 29th Design Autom. Conf, 1992, pp. 177–181.
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    • Pomeranz, I.1    Reddy, S.M.2
  • 10
    • 0002609165 scopus 로고
    • A neutral netlist of 10 combinational benchmark designs and a special translator in Fortran
    • June
    • F. Brglez and H. Fujiwara, “A neutral netlist of 10 combinational benchmark designs and a special translator in Fortran,” in Proc. Int. Symp. Circuits and Systems, June 1985.
    • (1985) Proc. Int. Symp. Circuits and Systems
    • Brglez, F.1    Fujiwara, H.2
  • 11
    • 0024913805 scopus 로고
    • Combinational profiles of sequential benchmark circuits
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    • F. Brglez et. al., “Combinational profiles of sequential benchmark circuits,” in Proc. Int. Symp. Circuits and Systems, May 1989, pp. 1929–1934.
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  • 13
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    • Hazard detection in combination and sequential circuits
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  • 14
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    • An efficient nonenumerative method to estimate path delay fault coverage
    • Nov.
    • I. Pomeranz and S. M. Reddy, “An efficient nonenumerative method to estimate path delay fault coverage,” in Proc. Int. Conf. Computer-Aided Design, Nov. 1992, pp. 560–567.
    • (1992) Proc. Int. Conf. Computer-Aided Design , pp. 560-567
    • Pomeranz, I.1    Reddy, S.M.2
  • 15
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    • SPADES: A simulator for path delay faults in sequential circuits
    • Sept.
    • I. Pomeranz, L. N. Reddy, and S. M. Reddy, “SPADES: A simulator for path delay faults in sequential circuits,” in Proc. EURO-DAC ‘92, Sept. 1992, pp. 428–435.
    • (1992) Proc. EURO-DAC '92 , pp. 428-435
    • Pomeranz, I.1    Reddy, L.N.2    Reddy, S.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.