ON DELAY FAULT TESTING IN LOGIC CIRCUITS.

Volumn , Issue , 1986, Pages 148-151

  Lin, C J ^a   Reddy, S M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER METATHEORY - MANY VALUED LOGICS; COMPUTER PROGRAMMING - ALGORITHMS; PROBABILITY;

DELAY FAULT TESTING; DETECTION PROBABILITY; NORMAL CLOCKING RATE TEST; PROPAGATION DELAYS;

LOGIC CIRCUITS;

EID: 0022990711     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)