Testing and built-in self-test - A survey

Journal of Systems Architecture

Volumn 46, Issue 9, 2000, Pages 721-747

  Steininger, Andreas ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Boundary scan; Built in self test; Response analysis; Scan path; Test pattern generation

Indexed keywords

EID: 0011734334     PISSN: 13837621     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1383-7621(99)00041-7     Document Type: Article

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