BUILT-IN LOGIC BLOCK OBSERVATION TECHNIQUES.

Digest of Papers - Semiconductor Test Symposium

Volumn , Issue , 1979, Pages 37-41

  Koenemann, Bernd ^a   Mucha, Joachim ^a   Zwiehoff, Guenther ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING;

LOGIC CIRCUITS;

EID: 0018809824     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)