Theory of transparent BIST for RAMs

IEEE Transactions on Computers

Volumn 45, Issue 10, 1996, Pages 1141-1156

  Nicolaidis, Michael ^a  

^a TIMA LABORATORY   (France)

Author keywords

BIST; Coupling faults; Pattern sensitive faults; RAM test algorithms; Signature analysis; Transparent BIST

Indexed keywords

ALGORITHMS; COMPUTATION THEORY; COMPUTER SIMULATION; COMPUTER SYSTEM RECOVERY; COMPUTER TESTING; MATHEMATICAL MODELS; THEOREM PROVING;

COUPLING FAULTS; FABRICATION TESTING; PATTERN SENSITIVE FAULTS; PERIODIC TESTING; SIGNATURE ANALYSIS; SIGNATURE VERIFICATION; TRANSPARENT BIST;

RANDOM ACCESS STORAGE;

EID: 0030260635     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.543708     Document Type: Article

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