Random pattern testing for sequential circuits revisited

Proceedings - Annual International Conference on Fault-Tolerant Computing

Volumn , Issue , 1996, Pages 44-52

  Nachman, Lama ^a   Saluja, Kewal K ^a   Upadhyaya, Shambhu ^a   Reuse, Robert ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; VECTORS;

AUTOMATIC TEST PATTERN GENERATOR (ATPG); RANDOM PATTERN TESTING;

SEQUENTIAL CIRCUITS;

EID: 0029703862     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)