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Volumn 12, Issue 4, 1998, Pages 319-332

Toward a predictive atomistic model of ion implantation and dopant diffusion in silicon

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EID: 0000954743     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0256(98)00024-X     Document Type: Article
Times cited : (15)

References (58)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.