The energies of microvoid formation in Si as a function of applied hydrostatic stress

Applied Physics Letters

Volumn 69, Issue 26, 1996, Pages 4071-

  Cuendet, Nicolas ^a   Halicioglu, Timur ^a   Tiller, William A ^a  

^a Stanford University   (United States)

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EID: 0006487358     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117821     Document Type: Article

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