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Volumn 76, Issue 23, 2000, Pages 3427-3429

Nano-oxidation of silicon surfaces by noncontact atomic-force microscopy: Size dependence on voltage and pulse duration

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EID: 0000605663     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126856     Document Type: Article
Times cited : (101)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.