Requirements for practical IDDQ testing of deep submicron circuits

Proceedings - 2000 IEEE International Workshop on Defect Based Testing

Volumn , Issue , 2000, Pages 15-20

  Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND CURRENT; DEEP-SUBMICRON CIRCUITS; FUTURE TECHNOLOGIES; INTERNATIONAL TECHNOLOGY ROADMAP FOR SEMICONDUCTORS; QUIESCENT CURRENTS;

DEFECTS;

EID: 84961967548     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DBT.2000.843685     Document Type: Conference Paper

References (34)

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