Micro IDDQ test using Lorentz force MOSFET's

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 1999, Pages 169-170

  Nose, Koichi ^a   Sakurai, Takayasu ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; ELECTRIC POWER SUPPLIES TO APPARATUS; ERROR DETECTION; GATES (TRANSISTOR); MOSFET DEVICES; SEMICONDUCTOR DEVICE STRUCTURES; SHIFT REGISTERS; VLSI CIRCUITS;

CURRENT SENSING DEVICE; DESIGN ERRORS; LORENTZ FORCE MOSFET; MAGNETIC SENSING DEVICE; PARALLEL CONNECTION; VOLTAGE DIFFERENCE;

INTEGRATED CIRCUIT TESTING;

EID: 0033280471     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)