Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 9, Issue 3, 1996, Pages 295-310

  Rius, Josep ^a,b   Figueras, Joan ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^b Electronics Department

Author keywords

Built In Current Sensors; Current testing; IDDQ testability

Indexed keywords

ELECTRIC POWER SUPPLIES TO APPARATUS; EXPERIMENTS; MONITORING; PERFORMANCE; SENSORS; TESTING;

BUILT-IN CURRENT SENSORS; CURRENT TESTING;

ELECTRIC CURRENT CONTROL;

EID: 0030402140     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00134693     Document Type: Article

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