IDDQ characterization in submicron CMOS

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 136-145

  Ferre, Antoni ^a   Figueras, Joan ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; STANDARDS;

SUBTHRESHOLD CURRENT DOMINANT TECHNOLOGY;

INTEGRATED CIRCUIT TESTING;

EID: 0031343645     PISSN: 10893539     EISSN: None     Source Type: None    
DOI: 10.1109/TEST.1997.639606     Document Type: Conference Paper

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