IDDQ testing of a 180MHz HP PA-RISC microprocessor with redundancy programmed caches

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 44-51

  Meneghini, Th ^a   Josephson, D ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; DESIGN; ELECTRIC CURRENTS; TESTING; TRANSISTORS;

IDDQ TEST; REDUNDANCY PROGRAMMED CACHES;

MICROPROCESSOR CHIPS;

EID: 0031361501     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)