Estimation of defect-free IDDQ in submicron circuits using switch level simulation

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 882-889

  Maxwell, P C ^a   Rearick, J R ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; TRANSISTORS;

QUIESCENT CURRENTS; SOFTWARE PACKAGE SPICE; SWITCH LEVEL SIMULATION;

INTEGRATED CIRCUIT TESTING;

EID: 0032306412     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)