Statistical threshold formulation for dynamic Idd test

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 57-66

  Jiang, Wanli ^a   Vinnakota, Bapiraju ^a  

^a BOSTON SCIENTIFIC CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; LEAKAGE CURRENTS; PERFORMANCE; STATISTICAL METHODS; THRESHOLD VOLTAGE; TRANSIENTS;

ENERGY CONSUMPTION RATIO; FAULT COVERAGE LOSS; PRINCIPAL COMPONENT ANALYSIS; TRANSIENTS CURRENT TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0033309299     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (33)