An automatic testing and diagnosis for FPGAS

Proceedings - 1999 Pacific Rim International Symposium on Dependable Computing, PRDC 1999

Volumn , Issue , 1999, Pages 45-52

  Doumar, Abderrahim ^a   Ito, Hideo ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; STATIC RANDOM ACCESS STORAGE;

CHIP SIZES; OFF-CHIP MEMORY; SRAM MEMORY; TESTING CONFIGURATIONS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 84949292341     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PRDC.1999.816211     Document Type: Conference Paper

References (19)

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