Non-Contact Local Conductance Mapping of Individual Graphene Oxide Sheets during the Reduction Process

Journal of Physical Chemistry Letters

Volumn 6, Issue 13, 2015, Pages 2629-2635

  Jeong, Huiseong ^a   Lee, Kyung Moon ^a   Ahn, Y H ^a   Lee, Soonil ^a   Park, Ji Yong ^a  

^a Ajou University   (South Korea)

Author keywords

Conductance; Electrostatic Force Microscopy; Graphene Oxide; Reduction

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC FIELDS; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; ELECTROSTATICS; GRAPHENE; REDUCTION;

CHEMICAL REDUCTION; CONDUCTING PROPERTIES; CONDUCTING STATE; ELECTROSTATIC FORCE MICROSCOPY; GRAPHENE OXIDES; IV CHARACTERISTICS; REDUCTION PROCESS; SPATIAL EVOLUTION;

ELECTRIC FORCE MICROSCOPY;

EID: 84947771037     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/acs.jpclett.5b01008     Document Type: Article

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