|
Volumn 4, Issue 22, 2012, Pages 7231-7236
|
Fast and non-invasive conductivity determination by the dielectric response of reduced graphene oxide: An electrostatic force microscopy study
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHEMICALLY DERIVED GRAPHENE;
CONTACTLESS TECHNIQUE;
DIELECTRIC RESPONSE;
EFFECTIVE PERMITTIVITY;
ELECTROSTATIC FORCE MICROSCOPY;
REDUCED GRAPHENE OXIDES;
REDUCED GRAPHENE OXIDES (RGO);
THIN DIELECTRIC LAYER;
ELECTRIC FIELDS;
ELECTROSTATIC FORCE;
GRAPHENE;
NONINVASIVE MEDICAL PROCEDURES;
ELECTRIC FORCE MICROSCOPY;
GRAPHITE;
OXIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
ELECTRIC CONDUCTIVITY;
OXIDATION REDUCTION REACTION;
STATIC ELECTRICITY;
THEORETICAL MODEL;
ELECTRIC CONDUCTIVITY;
GRAPHITE;
MICROSCOPY, ATOMIC FORCE;
MODELS, THEORETICAL;
OXIDATION-REDUCTION;
OXIDES;
STATIC ELECTRICITY;
|
EID: 84871725925
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c2nr32640j Document Type: Article |
Times cited : (12)
|
References (35)
|