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Volumn 7, Issue 14, 2015, Pages 6255-6260
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Thickness-dependent mobility in two-dimensional MoS2 transistors
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
ENERGY GAP;
LAYERED SEMICONDUCTORS;
MOLYBDENUM COMPOUNDS;
MONOLAYERS;
SULFUR COMPOUNDS;
FIELD EFFECT TRANSISTOR (FETS);
FIELD-EFFECT MOBILITIES;
INVERSION SYMMETRY;
MOLYBDENUM DISULPHIDE;
SUBSTRATE ROUGHNESS;
TECHNOLOGICAL APPLICATIONS;
TWO DIMENSIONAL (2 D);
VERTICAL DIRECTION;
FIELD EFFECT TRANSISTORS;
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EID: 84926049996
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c4nr06331g Document Type: Article |
Times cited : (78)
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References (31)
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