Visibility of dichalcogenide nanolayers

Nanotechnology

Volumn 22, Issue 12, 2011, Pages

  Benameur, M M ^a   Radisavljevic, B ^a   Heron J S ^a   Sahoo, S ^a   Berger, H ^a   Kis, A ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; DICHALCOGENIDES; ELECTRICAL PROPERTY; LAYERED MATERIAL; NANO LAYERS; ON-WAFER; OPTICAL DETECTION; OPTICAL IMAGING; OPTICAL MODELS; OPTIMAL IMAGING; SINGLE LAYER; ULTRA-THIN;

ELECTRIC PROPERTIES; MATERIALS PROPERTIES; MOLYBDENUM COMPOUNDS; SILICON COMPOUNDS; SUPERCONDUCTING MATERIALS; VIDEO CAMERAS;

NANOSTRUCTURES;

EID: 79951840727     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/12/125706     Document Type: Article

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