Large-angle illumination STEM: Toward three-dimensional atom-by-atom imaging

Ultramicroscopy

Volumn 151, Issue , 2015, Pages 122-129

  Ishikawa, Ryo ^a   Lupini, Andrew R ^b   Hinuma, Yoyo ^c   Pennycook, Stephen J ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c KYOTO UNIVERSITY   (Japan)

^d University of Tennessee   (United States)

Author keywords

Annular dark field (ADF); Atomic depth resolution imaging; Scanning transmission electron microscopy (STEM); Surface imaging

Indexed keywords

ABERRATIONS; ELECTRON MICROSCOPY; ELECTRONS; IMAGE RECONSTRUCTION; MATERIALS PROPERTIES; POINT DEFECTS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC DEPTH; CHROMATIC ABERRATION; CRYSTALLOGRAPHIC ORIENTATIONS; DARK FIELD; LARGE ANGLE ILLUMINATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE IMAGING; THREE-DIMENSIONAL SURFACE;

ATOMS;

ARTICLE; ATOM; CHEMICAL STRUCTURE; CRYSTALLOGRAPHY; GEOMETRY; ILLUMINATION; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; LARGE ANGLE ILLUMINATION SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; STATISTICAL ANALYSIS; SURFACE PROPERTY; THICKNESS; THREE DIMENSIONAL IMAGING;

EID: 84924798372     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.11.009     Document Type: Article

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