Quantitative annular dark field electron microscopy using single electron signals

Microscopy and Microanalysis

Volumn 20, Issue 1, 2014, Pages 99-110

  Ishikawa, Ryo ^a   Lupini, Andrew R ^a   Findlay, Scott D ^b   Pennycook, Stephen J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b MONASH UNIVERSITY   (Australia)

Author keywords

Aberration correction; ADF; Counting atoms; EELS; Image simulation; Quantitative microscopy; Single electron; STEM

Indexed keywords

EID: 84896448218     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927613013664     Document Type: Article

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