Thermal diffuse scattering in transmission electron microscopy

Ultramicroscopy

Volumn 111, Issue 12, 2011, Pages 1670-1680

  Forbes, B D ^a   D'Alfonso, A J ^a   Findlay, S D ^b   Van Dyck, D ^c   LeBeau, J M ^d   Stemmer, S ^e   Allen, L J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b MONASH UNIVERSITY   (Australia)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

^e University of California   (United States)

Author keywords

Stobbs factor; Thermal diffuse scattering; Transmission electron microscopy

Indexed keywords

BRIGHT FIELDS; COMPUTING RESOURCE; CONTRAST TRANSFER FUNCTION; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES; DIFFUSE SCATTERING; IMAGE CONTRASTS; NUMERICAL IMPLEMENTATION; OBJECTIVE LENS; QUANTITATIVE COMPARISON; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STOBBS FACTOR;

EXPERIMENTS; MATHEMATICAL MODELS; TRANSMISSION ELECTRON MICROSCOPY;

SCATTERING;

ACCURACY; ARTICLE; CONSTANT TRANSFER; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; PHYSICAL PARAMETERS; QUANTITATIVE ANALYSIS; SAMPLING; SIMULATION; STOBBS FACTOR; THERMAL DIFFUSE SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 81055154919     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.09.017     Document Type: Article

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