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Volumn 106, Issue 2, 2015, Pages

Piezoresistive characterization of bottom-up, n-type silicon microwires undergoing bend deformation

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEFORMATION; NANOWIRES; OHMIC CONTACTS; SEMICONDUCTING SILICON; SILICON; WIRE;

EID: 84923899780     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4906034     Document Type: Article
Times cited : (11)

References (37)
  • 1
    • 33846693940 scopus 로고
    • C. S. Smith, Phys. Rev. 94, 42 (1954). 10.1103/PhysRev.94.42
    • (1954) Phys. Rev. , vol.94 , pp. 42
    • Smith, C.S.1
  • 6
    • 67849115757 scopus 로고    scopus 로고
    • H. B. Gray, Nat. Chem. 1, 112 (2009). 10.1038/nchem.206
    • (2009) Nat. Chem. , vol.1 , pp. 112
    • Gray, H.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.