Pure bending strains of Nb3Sn wires

Superconductor Science and Technology

Volumn 24, Issue 4, 2011, Pages

  Takayasu, Makoto ^a   Chiesa, Luisa ^a,b   Harris, David L ^a,c   Allegritti, Andrea ^a,d   Minervini, Joseph V ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Tufts University   (United States)

^c Depth Enterprises LLC   (United States)

^d JPMorganChase   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING EFFECT; BENDING LOAD; BENDING STRAIN; CURRENT TRANSFER; INTEGRATED MODELS; INTERNAL TIN; MODEL ANALYSIS; NEUTRAL AXIS; PURE BENDING; TEST DEVICE; UNI-AXIAL STRAINS; UNIFORM BENDING;

LORENTZ FORCE; MAGNETIC FIELD EFFECTS; STRAIN; WIRE;

TIN;

EID: 79951828698     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/24/4/045012     Document Type: Article

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