Integrating electron and near-field optics: Dual vision for the nanoworld

Nanophotonics

Volumn 3, Issue 1-2, 2014, Pages 75-89

  Haegel, Nancy M ^a  

^a NAVAL POSTGRADUATE SCHOOL   (United States)

Author keywords

Cathodoluminescence; Diffusion; Energy transport; Integrated; Near field scanning optical microscope; Scanning electron microscope; Transport imaging

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; DIFFUSION; ELECTRONS; ENERGY TRANSFER; ION BEAMS; LIGHT; OPTICAL MICROSCOPY; PLASMONS; SCANNING ELECTRON MICROSCOPY; SURFACE TOPOGRAPHY; TRANSPORT PROPERTIES;

ELECTRON OPTICS SYSTEM; ENERGY TRANSPORT; INTEGRATED; LOCALIZED EXCITATIONS; MATERIALS CHARACTERIZATION; NEAR-FIELD OPTICAL IMAGING; SEMICONDUCTOR NANODEVICES; TRANSPORT IMAGING;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 84921342077     PISSN: None     EISSN: 21928614     Source Type: Journal    
DOI: 10.1515/nanoph-2013-0048     Document Type: Review

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