Optical measurement of the ambipolar diffusion length in a ZnCdSe-ZnSe single quantum well

Journal of Applied Physics

Volumn 81, Issue 1, 1997, Pages 536-538

  Logue, F P ^a   Fewer, D T ^a   Hewlett, S J ^a   Heffernan, J F ^a   Jordan, C ^a   Rees, P ^a   Donegan, J F ^a   McCabe, E M ^a   Hegarty, J ^a   Taniguchi, S ^b   Hino, T ^b   Nakano, K ^b   Ishibashi, A ^b  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012293639     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364094     Document Type: Article

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