Scanning near-field cathodoluminescence microscopy for semiconductor investigations: A theoretical study

Journal of Applied Physics

Volumn 86, Issue 8, 1999, Pages 4326-4332

  Pastre D ^a   Troyon, M ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007994285     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371365     Document Type: Article

References (20)

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