Resolution in scanning near-field cathodoluminescence microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 3, 2000, Pages 1138-1143

  Pastre D ^a   Bubendorff, J L ^a   Troyon, M ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DOPING (ADDITIVES); ENERGY TRANSFER; FLUORSPAR; INTEGRATION; MAGNESIA; MATHEMATICAL MODELS; MONTE CARLO METHODS; OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; SCANNING; TENSORS;

SCANNING NEAR FIELD CATHODOLUMINESCENCE MICROSCOPY (SNCLM);

CATHODOLUMINESCENCE;

EID: 0034187908     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591349     Document Type: Article

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