Scanning near-field electron beam induced current microscopy: Application to III-V heterostructures and quantum dots

Applied Physics Letters

Volumn 90, Issue 21, 2007, Pages

  Troyon, M ^a   Smaali, K ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION; ELECTRON BEAMS; NANOINDENTATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS;

CARRIER DIFFUSION; DIFFUSION LENGTH; EBIC IMAGING; ELECTRON BEAM INDUCED CURRENT MICROSCOPY; HYBRID SYSTEM;

HETEROJUNCTIONS;

EID: 34249697085     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2742638     Document Type: Article

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