Imaging transport in nanowires using near-field detection of light

Journal of Crystal Growth

Volumn 352, Issue 1, 2012, Pages 218-223

  Haegel, N M ^a   Chisholm, D J ^a   Cole, R A ^a  

^a NAVAL POSTGRADUATE SCHOOL   (United States)

Author keywords

A1. Characterization; A1. Diffusion; A1. Nanostructures; A1. Optical microscopy; B2. Semiconducting II VI materials

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CHARGE GENERATION; ELECTRICAL CONTACTS; EMITTED LIGHT; EXCITON DIFFUSION LENGTH; HOLE TRANSPORTS; MINORITY CARRIER; MINORITY CARRIER DIFFUSION LENGTH; NEAR FIELD OPTICS; NEAR-FIELD; NEW RESULTS; OPTICAL AND ELECTRONIC PROPERTIES; OPTICAL IMAGE; RECOMBINATION EMISSION; SCANNING ELECTRON MICROSCOPE; SCANNING OPTICAL; SEMICONDUCTING II-VI MATERIALS; SPATIAL INFORMATIONS; ZNO NANOWIRES;

CHARACTERIZATION; CRYSTAL GROWTH; ELECTRONIC PROPERTIES; ENERGY CONVERSION; GEOMETRICAL OPTICS; NANOBELTS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; ZINC OXIDE;

NANOWIRES;

EID: 84863333710     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2011.12.067     Document Type: Conference Paper

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